Package-level declarations

Generates measurements that can later be used both by accelerometer and gyroscope calibrators. Measurements are generated by taking into account static and dynamic intervals on the device, when the device is kept static (e.g. motionless), or when some force is applied to the device changing its position or orientation. Static and dynamic intervals are always measured using the accelerometer. Additionally, the gyroscope is also used, and measurements are generated to calibrate both accelerometers and gyroscopes. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.

Generates measurements that can later be used by accelerometer, gyroscope and magnetometer calibrators. Measurements are generated by taking into account static and dynamic intervals on the device, when the device is kept static (e.g. motionless), or when some force is applied to the device changing its position or orientation. Static and dynamic intervals are always measured using the accelerometer. Additionally, the gyroscope and magnetometer are also used, and measurements are generated to calibrate either accelerometers, gyroscopes or magnetometers. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.

Generates measurements that can later be used by accelerometer calibrators. Measurements are generated by taking into account static and dynamic intervals on the device, when the device is kept static (e.g. motionless), or when some force is applied to the device changing its position or orientation. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.

Base class to generate calibration measurements. Measurements are generated by taking into account static and dynamic intervals on the device, where the device is kept static (e.g. motionless), or where some force is applied to the device changing its position or orientation. Static and dynamic intervals are always measured using the accelerometer. An additional sensor such as the gyroscope or magnetometer can be used to generate measurements for them. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.

Generates measurements that can later be used by gyroscope calibrators. Measurements are generated by taking into account static and dynamic intervals on the device, when the device is kept static (e.g. motionless), or when some force is applied to the device changing its position or orientation. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.

Generates measurements that can later be used by magnetometer calibrators. Measurements are generated by taking into account static and dynamic intervals on the device, when the device is kept static (e.g. motionless), or when same force is applied to the device changing its position or orientation. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.

Base class to generate measurements for a single sensor that can later be used by calibrators of such sensor. Measurements are generated by taking into account static and dynamic intervals on the device, where the device is kept static (e.g. motionless), or where some force is applied to the device changing its position or orientation. Static and dynamic intervals are measured using the only sensor used by the generator. Measurement generator converts device ENU measurements into measurements expressed in local tangent plane NED coordinates.